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Programmable, automated transistor test systemA programmable, automated transistor test system was built to supply experimental data on new and advanced power semiconductors. The data will be used for analytical models and by engineers in designing space and aircraft electric power systems. A pulsed power technique was used at low duty cycles in a nondestructive test to examine the dynamic switching characteristic curves of power transistors in the 500 to 1000 V, 10 to 100 A range. Data collection, manipulation, storage, and output are operator interactive but are guided and controlled by the system software.
Document ID
19860012284
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Truong, L. V.
(NASA Lewis Research Center Cleveland, OH, United States)
Sundburg, G. R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
January 1, 1986
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NAS 1.60:2554
NASA-TP-2554
E-2768
Meeting Information
Meeting: Symposium on Space Nuclear Power Systems
Location: Albuquerque, NM
Country: United States
Start Date: January 13, 1986
End Date: January 16, 1986
Accession Number
86N21755
Funding Number(s)
PROJECT: RTOP 506-55-72
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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