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Total-dose radiation effects data for semiconductor devices. 1985 supplement. Volume 2, part ASteady-state, total-dose radiation test data, are provided in graphic format for use by electronic designers and other personnel using semiconductor devices in a radiation environment. The data were generated by JPL for various NASA space programs. This volume provides data on integrated circuits. The data are presented in graphic, tabular, and/or narrative format, depending on the complexity of the integrated circuit. Most tests were done using the JPL or Boeing electron accelerator (Dynamitron) which provides a steady-state 2.5 MeV electron beam. However, some radiation exposures were made with a Cobalt-60 gamma ray source, the results of which should be regarded as only an approximate measure of the radiation damage that would be incurred by an equivalent electron dose.
Document ID
19860023705
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Martin, K. E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Gauthier, M. K. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Coss, J. R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dantas, A. R. V. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Price, W. E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 5, 2013
Publication Date
May 15, 1986
Subject Category
Solid-State Physics
Report/Patent Number
NAS 1.26:179746
NASA-CR-179746
JPL-PUB-85-43-VOL-2-PT-A
Accession Number
86N33177
Funding Number(s)
PROJECT: RTOP 323-51-43-00-11
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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