NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Optical property measurements as a diagnostic tool for control of materials processing in space and on EarthA new method is described, including results, to measure, control, and follow containerless processing in ground based levitators. This technique enables instantaneous optical property measurements from a transient solid or liquid surface concurrent with true temperature measurement. This was used successfully as a diagnostic tool to follow processing of Al, Si, and Ti during electromagnetic levitation. Experiments on Al show the disappearance of the oxide (emittance 0.33) at ca. 1300 C leaving a liquid surface with an emittance of 0.06. Electromagnetic levitation of silicon shows a liquid with a constant emittance (0.2) but with a solid whose emittance decreases very rapidly with increasing temperature. Consequently, the processing of materials at high temperatures can be controlled quite well through the control of surface optical properties.
Document ID
19910012053
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Krishnan, Shankar (Intersonics, Inc. Northbrook, IL, United States)
Weber, J. K. Richard (Intersonics, Inc. Northbrook, IL, United States)
Nordine, Paul C. (Intersonics, Inc. Northbrook, IL, United States)
Schiffman, Robert A. (Intersonics, Inc. Northbrook, IL, United States)
Date Acquired
September 6, 2013
Publication Date
May 1, 1990
Publication Information
Publication: JPL, Proceedings of the First Workshop on Containerless Experimentation in Microgravity
Subject Category
Materials Processing
Accession Number
91N21366
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

There are no records associated with this record.
No Preview Available