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Method and apparatus for deflection measurements using eddy current effectsA method and apparatus for inserting and moving a sensing assembly with a mechanical positioning assembly to a desired remote location of a surface of a specimen under test and measuring angle and/or deflection by sensing the change in the impedance of at least one sensor coil located in a base plate which has a rotatable conductive plate pivotally mounted thereon so as to uncover the sensor coil(s) whose impedance changes as a function of deflection away from the center line of the base plate in response to the movement of the rotator plate when contacting the surface of the specimen under test is presented. The apparatus includes the combination of a system controller, a sensing assembly, an eddy current impedance measuring apparatus, and a mechanical positioning assembly driven by the impedance measuring apparatus to position the sensing assembly at a desired location of the specimen.
Document ID
19930016914
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Chern, Engmin J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 15, 2013
Publication Date
May 25, 1993
Subject Category
Instrumentation And Photography
Accession Number
93N26103
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-GSC-13506-1|US-PATENT-5,214,379
Patent Application
US-PATENT-APPL-SN-904308

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