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Tape recorder failure investigationTwo end-item tape recorders lost 4:1 mode data recording mode capability at less than half of their 1 6,000-cycle, 4-year operating life. Subsequent life tests on two spare recorders also experienced 4:1 mode data loss at 8,000 and 11,700 cycles. Tear down inspection after completion of the life tests showed that the tape had worn through the alfesil record and reproduce heads. An investigation was initiated to understand the cause of excessive tape head wear and the reasons why the 4:1 mode data rate, low-speed mode is more damaging than the 1:1 mode data rate, high-speed recording mode. The objective was to establish how operating conditions (tape speed, humidity, temperature, stop/start cycles) affects head life with the goal of extending head life on the remaining in-service tape recorders. Another interest was to explain why an earlier vendor life test showed capability beyond 16,000 cycles.
Document ID
19960025599
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Higgins, M. D. (Lockheed Martin Missile and Space Sunnyvale, CA United States)
Loewenthal, S. H. (Lockheed Martin Missile and Space Sunnyvale, CA United States)
Carnahan, C. C. (Lockheed Martin Missile and Space Sunnyvale, CA United States)
Snyder, G. L. (Lockheed Martin Missile and Space Sunnyvale, CA United States)
Date Acquired
August 17, 2013
Publication Date
May 1, 1996
Publication Information
Publication: 30th Aerospace Mechanisms Symposium
Subject Category
Instrumentation And Photography
Accession Number
96N27605
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19960025595Collected Works30th Aerospace Mechanisms Symposium
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