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Microwave Reflectivity of Deposited Aluminum Films for Passive Relay CommunicationsReflectivity measurements from 400 Mc/sec to 10 kMc/sec on 2,200 A thick aluminum deposited on 1/2-mil-thick Mylar film show this material to be a very good reflector of radio waves. Measurements made under conditions of stress and temperature which would be encountered by a communications sphere, such as Project Echo (1960 Iota), showed very little deterioration of the high reflectivity. packaging effects also caused very little reflectivity change. Under conditions of severe temperature cycling, aluminum removal and decreased reflectivity occurred.
Document ID
20040008116
Acquisition Source
Langley Research Center
Document Type
Other - NASA Technical Note (TN)
Authors
Cuddihy, William F. (NASA Langley Research Center Hampton, VA, United States)
Shreve, Lloyd H. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 21, 2013
Publication Date
February 1, 1961
Subject Category
Instrumentation And Photography
Report/Patent Number
L-1312
NASA-TN-D-664
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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