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Evaluation of Data Retention and Imprint Characteristics of FRAMs Under Environmental Stresses for NASA ApplicationsA major reliability issue for all advanced nonvolatile memory (NVM) technology devices including FRAMs (Ferroelectric random access memories) is the data retention characteristics over extended period of time, under environmental stresses and exposure to total ionizing dose (TID) radiation effects. For this testing, 256 Kb FRAMs in 28-pin plastic DIPS, rated for industrial grade temperature range of -40 C to +85 C, were procured. These are two-transistor, two-capacitor (2T-2C) design FRAMs. In addition to data retention characteristics, the parts were also evaluated for imprint failures, which are defined as the failure of cells to change from a "preferred" state, where it has been for a significant period of time to an opposite state (e.g., from 1 to 0, or 0 to 1). These 256 K FRAMs were subjected to scanning acoustic microscopy (C-SAM); 1,000 temperature cycles from -65 C to +150 C; high temperature aging at 150 C, 175 C, and 200 C for 1,000 hours; highly accelerated stress test (HAST) for 500 hours; 1,000 hours of operational life test at 125 C; and total ionizing dose radiation testing. As a preconditioning, 10 K read/write cycles were performed on all devices. Interim electrical measurements were performed throughout this characterization, including special imprint testing and final electrical testing. Some failures were observed during high temperature aging test at 200 C, during HAST testing, and during 1,000 hours of operational life at 125 C. The parts passed 10 Krad exposure, but began showing power supply current increases during the dose increment from 10 Krad to 30 Krad, and at 40 Krad severe data retention and parametric failures were observed. Failures from various environmental group testing are currently being analyzed.
Document ID
20040053358
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Sharma, Ashok K. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Teverovsky, Alexander (QSS Group, Inc. Greenbelt, MD, United States)
Dowdy, Terry W. (Naval Sea Systems Command Crane, IN, United States)
Hamilton, Brett (Naval Sea Systems Command Crane, IN, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2000
Subject Category
Structural Mechanics
Meeting Information
Meeting: NVMTS 2002 Conference
Location: Honolulu, Hawaii
Country: United States
Start Date: November 4, 2002
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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