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Development of a Low-Cost and High-speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)A viewgraph presentation on the development of a low cost, high speed tester reconfigurable Field Programmable Gata Array (FPGA) is shown. The topics include: 1) Introduction; 2) Objectives; 3) Tester Descriptions; 4) Tester Validations and Demonstrations; 5) Future Work; and 6) Summary.
Document ID
20060028135
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Howard, J. W. (Mei Technology Corp. Seabrook, MD, United States)
Kim, H. (Mei Technology Corp. Seabrook, MD, United States)
Berg, M. (Mei Technology Corp. Seabrook, MD, United States)
LaBel, K. A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Stansberry, S. (Information Science Inst. Arlington, VA, United States)
Friendlich, M. (Mei Technology Corp. Seabrook, MD, United States)
Irwin, T. (Mei Technology Corp. Seabrook, MD, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2006
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Public Use Permitted.

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