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Solar cell anomaly detection method and apparatusA method is provided for detecting cracks and other imperfections in a solar cell, which includes scanning a narrow light beam back and forth across the cell in a raster pattern, while monitoring the electrical output of the cell to find locations where the electrical output varies significantly. The electrical output can be monitored on a television type screen containing a raster pattern with each point on the screen corresponding to a point on the solar cell surface, and with the brightness of each point on the screen corresponding to the electrical output from the cell which was produced when the light beam was at the corresponding point on the cell. The technique can be utilized to scan a large array of interconnected solar cells, to determine which ones are defective.
Document ID
20080004237
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Miller, Emmett L.
Shumka, Alex
Gauthier, Michael K.
Date Acquired
August 24, 2013
Publication Date
November 17, 1981
Subject Category
Solar Physics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-4,301,409
Patent Application
US-PATENT-APPL-SN-118627

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