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Are Current SEE Test Procedures Adequate for Modern Devices and Electronics Technologies?Believe it or not, this has been a simplistic look at starting a checklist for SEE testing. Given a memory that has 68 operating modes, when a SEU occurs that changes the mode, just how do you determine what's going on? Laser and microbeam tests can help, but not easily for modern packaged devices. Expanding this approach to other more complex devices such as ADCs or processors as well as analog devices should be considered. The recommendation is to use the existing text standards as the starting point. Just make your own checklist for the device/technology/issues being considered. At HEART 2007, we presented some of the burgeoning challenges associated with single event effect(SEE) testing of modern commercial memories: a) Package, device complexity, test fixture, and data analysis issues were discussed; b) "Complete" SEE Characterization would take 15 years; c) Qualification test costs have a greater than 4 times increase over the last decade. In this talk, we continue to explore the roles of technology with an emphasis on the existing SEE Test Procedures and some of the concerns related to modern devices. The primary objective of the briefing is to provide some overarching guidance concerning the many considerations involved in the formulation of a SEE test plan provided in a " Checklist" format.we note that there is no such thing as a complete check list and that the best approach is to develop a flexible test plan that takes into account the device type and functions, the device technology, circuit and package design, and, of course, test facility and beam characteristics.
Document ID
20080045417
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cohn, Lewis M. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
March 31, 2008
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2008 Hardened Electronics and Radiation Technology (HEART)
Location: Colorado Springs, CO
Country: United States
Start Date: March 31, 2008
End Date: April 4, 2008
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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