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Scanning Electron Microscopy Investigation of a Sample Depth Profile Through the Martian Meteorite NakhlaThe ongoing scientific debate as to whether or not the Martian meteorite ALH84001 contained evidence of possible biogenic activities showed the need to establish consistent methods to ascertain the origin of such evidence. To distinguish between terrestrial organic material/microbial contaminants and possible indigenous microbiota within meteorites is therefore crucial. With this in mind a depth profile consisting of four samples from a new sample allocation of Martian meteorite Nakhla was investigated using scanning electron microscopy (SEM) and energy dispersive X-ray analysis. SEM imaging of freshly broken fractured chips revealed structures strongly recent terrestrial microorganisms, in some cases showing evidence of active growth. This conclusion was supported by EDX analysis, which showed the presence of carbon associated with these structures, we concluded that these structures represent recent terrestrial contaminants rather than structures indigenous to the meteorite. Page
Document ID
20100036491
Acquisition Source
Johnson Space Center
Document Type
Preprint (Draft being sent to journal)
Authors
Toporski, Jan (Portsmouth Univ. Portsmouth, United Kingdom)
Steele, Andrew (NASA Johnson Space Center Houston, TX, United States)
Westall, Frances (Lunar and Planetary Inst. Houston, TX, United States)
McKay, David S. (NASA Johnson Space Center Houston, TX, United States)
Date Acquired
August 25, 2013
Publication Date
January 1, 2000
Subject Category
Geophysics
Report/Patent Number
JSC-CN-6475
Funding Number(s)
PROJECT: RTOP 344-50-92-02
Distribution Limits
Public
Copyright
Public Use Permitted.

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