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Techniques for Characterizing Microwave Printed AntennasThe combination of a de-embedding technique and a direct on-substrate measurement technique has been devised to enable measurement of the electrical characteristics (impedances, scattering parameters, and gains) of microwave printed antennas that may be formed integrally with feed networks that include slot lines, coplanar striplines, and/or coplanar waveguides. The combination of techniques eliminates the need for custom test fixtures, including transitions between (1) coaxial or waveguide feed lines in typical test equipment and (2) the planar waveguide structures of the printed circuits under test. The combination of techniques can be expected to be especially useful for rapid, inexpensive, and accurate characterization of antennas for miniature wireless communication units that operate at frequencies from a few to tens of gigahertz.
Document ID
20110024023
Acquisition Source
Glenn Research Center
Document Type
Other - NASA Tech Brief
External Source(s)
http://www.techbriefs.com/component/content/532?task=view
Authors
Simons, Rainee (Federal Data Corp. Cleveland, OH, United States)
Lee, Richard Q. (NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
August 25, 2013
Publication Date
December 1, 2003
Publication Information
Publication: NASA Tech Briefs, December 2003
Subject Category
Man/System Technology And Life Support
Report/Patent Number
LEW-17040
Distribution Limits
Public
Copyright
Public Use Permitted.

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IDRelationTitle20110023998Collected WorksNASA Tech Briefs, December 2003
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