NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Development of a Bayesian Belief Network Runway Incursion ModelIn a previous paper, a statistical analysis of runway incursion (RI) events was conducted to ascertain their relevance to the top ten Technical Challenges (TC) of the National Aeronautics and Space Administration (NASA) Aviation Safety Program (AvSP). The study revealed connections to perhaps several of the AvSP top ten TC. That data also identified several primary causes and contributing factors for RI events that served as the basis for developing a system-level Bayesian Belief Network (BBN) model for RI events. The system-level BBN model will allow NASA to generically model the causes of RI events and to assess the effectiveness of technology products being developed under NASA funding. These products are intended to reduce the frequency of RI events in particular, and to improve runway safety in general. The development, structure and assessment of that BBN for RI events by a Subject Matter Expert panel are documented in this paper.
Document ID
20140011411
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Green, Lawrence L.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 8, 2014
Publication Date
June 16, 2014
Subject Category
Statistics And Probability
Air Transportation And Safety
Report/Patent Number
AIAA Paper 2014-2158
NF1676L-17837
Meeting Information
Meeting: AIAA Aviation Technology, Integration and Operations (ATIO) Conference
Location: Atlanta, GA
Country: United States
Start Date: June 16, 2014
End Date: June 20, 2014
Sponsors: American Inst. of Aeronautics and Astronautics
Funding Number(s)
WBS: WBS 284848.02.01.07.04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available