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Decline in Radiation Hardened Microcircuit InfrastructureTwo areas of radiation hardened microcircuit infrastructure will be discussed: 1) The availability and performance of radiation hardened microcircuits, and, and 2) The access to radiation test facilities primarily for proton single event effects (SEE) testing. Other areas not discussed, but are a concern include: The challenge for maintaining radiation effects tool access for assurance purposes, and, the access to radiation test facilities primarily for heavy ion single event effects (SEE) testing. Status and implications will be discussed for each area.
Document ID
20150022446
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
December 8, 2015
Publication Date
May 18, 2015
Subject Category
Electronics And Electrical Engineering
Quality Assurance And Reliability
Report/Patent Number
GSFC-E-DAA-TN36593
GSFC-E-DAA-TN22537
Meeting Information
Meeting: European Space Research Institute (ESRIN) Trilateral Face-to-face (F2F) Working Group Meeting
Location: Frascati
Country: Italy
Start Date: May 22, 2015
Sponsors: European Space Agency. ESRIN
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
performance of radiation hardened microcircuits
proton single event effects (SEE) testing
NASA Electronic Parts and Packaging (NEPP) Program
radiation hardened microcircuit infrastructure
radiation test facilities

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