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What Can We Learn From Proton Recoils about Heavy-Ion SEE Sensitivity?The fact that protons cause single-event effects (SEE) in most devices through production of light-ion recoils has led to attempts to bound heavy-ion SEE susceptibility through use of proton data. Although this may be a viable strategy for some devices and technologies, the data must be analyzed carefully and conservatively to avoid over-optimistic estimates of SEE performance. We examine the constraints that proton test data can impose on heavy-ion SEE susceptibility.
Document ID
20160001646
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Ladbury, Raymond L. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
February 5, 2016
Publication Date
January 11, 2016
Subject Category
Nuclear Physics
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN28927
Meeting Information
Meeting: JEDEC JC-13 Joint Electron Device Engineering Council (JEDEC), Committee Meeting
Location: Jacksonville, FL
Country: United States
Start Date: January 11, 2016
End Date: January 14, 2016
Sponsors: Joint Electron Device Engineering Council (JEDEC)
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
probabilistic risk assessment
proton SEE
Single-Event Effects (SEE)
hardness assurance
heavy-ion SEE

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