An Evaluation of Flash Cells Used in Critical Applications

Katz, Richard B.; Flowers, David; Bergevin, Keith

Due to the common use of Flash technology in many commercial and industrial Programmable Logic Devices (PLDs) such as FPGAs and mixed-signal microcontrollers, flash technology is being utilized in fuzed munition applications. This presents a long-term reliability issue for both DoD and NASA safety- and mission-critical applications. A thorough understanding of the data retention failure modes and statistics associated with Flash data retention is of vital concern to the fuze safety community. A key retention parameter for a flash cell is the threshold voltage (VTH), which is an indirect indicator of the amount of charge stored on the cells floating gate. Initial test results based on a study of charge loss in flash cells in an FPGA device is presented. Statistical data taken from a small sample set indicates quantifiable charge loss for devices stored at both room temperature and 150 C. Initial evaluation of the distribution of threshold voltage in a large sample set (800 devices) is presented. The magnitude of charge loss from exposure to electrostatic discharge and electromagnetic fields is measured and presented. Simulated data (and measured data as available) resultant from harsh-environment testing (neutron, heavy ion, EMP) is presented.

Document ID

20160007365

Acquisition Source

Goddard Space Flight Center

Document Type

Presentation

Authors

Date Acquired

June 8, 2016

Publication Date

May 3, 2016

Subject Category

Report/Patent Number

Meeting Information

Meeting: Annual Fuze Conference (NDIA)

Location: Charleston, SC

Country: United States

Start Date: May 3, 2016

End Date: May 5, 2016

Sponsors: National Defense Industrial Association

Distribution Limits

Public

Work of the US Gov. Public Use Permitted.

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