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Comparison of Signal Response Between EDM Notch and Cracks in Eddy-Current TestingIn the field of ET an eddy-current instrument is calibrated on a manufactured notch that is designed to simulate a defect in a part. The calibrated instrument is then used to scan parts with the assumption that any response that is over half the amplitude of the notch signal is taken to be defective. The purpose of this study is to attempt a direct comparison of the signal response observed from an EDM notch to a crack of the same size. To make this comparison test equipment will be set up and calibrated as per normal inspection procedures. Once this has been achieved both notches and as many different sizes of crack specimens will be scanned and the data recorded. This data will then be analyzed to provide a comparison of the response. The results should also provide information that shows it is acceptable to use the half-amplitude method for determining if a part is defective. The tests will be performed on two different materials commonly inspected, titanium and aluminum. This will allow a comparison of the results between materials.
Document ID
20160011246
Acquisition Source
Johnson Space Center
Document Type
Other
Authors
Kane, Mary (NASA Johnson Space Center Houston, TX, United States)
Koshti, Ajay (NASA Johnson Space Center Houston, TX, United States)
Date Acquired
September 14, 2016
Publication Date
September 29, 2008
Subject Category
Electronics And Electrical Engineering
Metals And Metallic Materials
Report/Patent Number
JSC-CN-37475
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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