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A Thermal Runaway Failure Model for Low-Voltage BME Ceramic Capacitors with DefectsReliability of base metal electrode (BME) multilayer ceramic capacitors (MLCCs) that until recently were used mostly in commercial applications, have been improved substantially by using new materials and processes. Currently, the inception of intrinsic wear-out failures in high quality capacitors became much greater than the mission duration in most high-reliability applications. However, in capacitors with defects degradation processes might accelerate substantially and cause infant mortality failures. In this work, a physical model that relates the presence of defects to reduction of breakdown voltages and decreasing times to failure has been suggested. The effect of the defect size has been analyzed using a thermal runaway model of failures. Adequacy of highly accelerated life testing (HALT) to predict reliability at normal operating conditions and limitations of voltage acceleration are considered. The applicability of the model to BME capacitors with cracks is discussed and validated experimentally.
Document ID
20170003045
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Teverovsky, Alexander
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Date Acquired
April 6, 2017
Publication Date
April 2, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN39385
Meeting Information
Meeting: IRPS 2017 Symposium
Location: Monterey, CA
Country: United States
Start Date: April 2, 2017
End Date: April 6, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
reliability
thermal runaway
failures
simulation
ceramic capacitors
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