Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Label, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States) Guertin, Steven M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Date Acquired
May 25, 2017
Publication Date
May 23, 2017
Subject Category
Quality Assurance And ReliabilityElectronics And Electrical Engineering Meeting Information
Meeting: Single Event Effects (SEE) Symposium Coupled with the Military and Aerospace Programmable Logic Devices (MAPLD) Workshop 2017
Location: San Diego, CA
Country: United States
Start Date: May 22, 2017
End Date: May 25, 2017
Sponsors: See Symposium (Single Event Effects)
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Electronic and Electromechanical (EEE) partsrisk management approachesCommercial off the Shelf (COTS); Electronic and Electromechanical (EEE) parts; r