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Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and Selected NASA Electronic Parts and Packaging ProgramTotal ionizing dose and displacement damage testing was performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
Document ID
20170006864
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Topper, Alyson D.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Campola, Michael J.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Chen, Dakai
(Analog Devices IMI, Inc. Berkeley, CA, United States)
Casey, Megan C.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Yau, Ka-Yen
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Cochran, Donna J.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Ladbury, Raymond L.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Lauenstein, Jean-Marie
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Mondy, Timothy K.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
O'Bryan, Martha V.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Pellish, Jonathan A.
(NASA Headquarters Washington, DC United States)
Wilcox, Edward P.
(ASRC Federal Space and Defense Greenbelt, MD, United States)
Xapsos, Michael A.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
July 19, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN44376
Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers, Jet Propulsion Lab., California Inst. of Tech., European Space Agency
Funding Number(s)
OTHER: 2017-561-NEPP
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Optoelectronics
Single Event Effects
and Total Ionizing Dose.
Proton Damage
Displacement Damage
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