Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Topper, Alyson D. (ASRC Federal Space and Defense Greenbelt, MD, United States) Campola, Michael J. (NASA Goddard Space Flight Center Greenbelt, MD United States) Chen, Dakai (Analog Devices IMI, Inc. Berkeley, CA, United States) Casey, Megan C. (NASA Goddard Space Flight Center Greenbelt, MD United States) Yau, Ka-Yen (ASRC Federal Space and Defense Greenbelt, MD, United States) Cochran, Donna J. (ASRC Federal Space and Defense Greenbelt, MD, United States) LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD United States) Ladbury, Raymond L. (NASA Goddard Space Flight Center Greenbelt, MD United States) Lauenstein, Jean-Marie (NASA Goddard Space Flight Center Greenbelt, MD United States) Mondy, Timothy K. (NASA Goddard Space Flight Center Greenbelt, MD United States) O'Bryan, Martha V. (ASRC Federal Space and Defense Greenbelt, MD, United States) Pellish, Jonathan A. (NASA Headquarters Washington, DC United States) Wilcox, Edward P. (ASRC Federal Space and Defense Greenbelt, MD, United States) Xapsos, Michael A. (NASA Goddard Space Flight Center Greenbelt, MD United States) Date Acquired
July 19, 2017
Publication Date
July 17, 2017
Subject Category
Electronics And Electrical Engineering Meeting Information
Meeting: 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017)
Location: New Orleans, LA
Country: United States
Start Date: July 17, 2017
End Date: July 21, 2017
Sponsors: Institute of Electrical and Electronics Engineers, Jet Propulsion Lab., California Inst. of Tech., European Space Agency
Funding Number(s)
OTHER: 2017-561-NEPP
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Optoelectronics Single Event Effects and Total Ionizing Dose. Proton DamageDisplacement Damage