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Analyzing System on A Chip Single Event Upset Responses using Single Event Upset Data, Classical Reliability Models, and Space Environment DataWe are investigating the application of classical reliability performance metrics combined with standard single event upset (SEU) analysis data. We expect to relate SEU behavior to system performance requirements. Our proposed methodology will provide better prediction of SEU responses in harsh radiation environments with confidence metrics. single event upset (SEU), single event effect (SEE), field programmable gate array devises (FPGAs)
Document ID
20170009889
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
External Source(s)
https://nepp.nasa.gov/
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
October 11, 2017
Publication Date
October 6, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN64802
GSFC-E-DAA-TN47270
Meeting Information
Meeting: 2017 Radiation Effects on Components and Systems (RADECS) Conference
Location: Geneva
Country: Switzerland
Start Date: October 2, 2017
End Date: October 6, 2017
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
OTHER: 2017-561-NEPP
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Keywords
single event effect (SEE)
single event upset (SEU)
field programmable gate array devises (FPGAs

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