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Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits

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Flandre, Denis [UCL] Kilchytska, Valeriya [UCL] Alvarado Pulido, José Joaquin [UCL] Boufouss, El Hafed [UCL] Assaad, Maher [UCL] Rue, Bertrand [UCL] Roda Neve, Cesar [UCL] Raskin, Jean-Pierre [UCL] Francis, Laurent [UCL]
Document type Communication à un colloque (Conference Paper) – Conférence invitée / Keynote
Publication date 2011
Language Anglais
Conference "2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011)", Ghent (Belgium) (du 06/06/2011 au 09/06/2011)
Peer reviewed yes
Host document
Publication status Publié
Affiliation UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique
Keywords CMOS
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Bibliographic reference Flandre, Denis ; Kilchytska, Valeriya ; Alvarado Pulido, José Joaquin ; Boufouss, El Hafed ; Assaad, Maher ; et. al. Extreme-environment behaviors and performances of advanced Silicon-on-Insulator CMOS sensors, transistors and circuits.2nd International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and their Applications (ANIMMA 2011) (Ghent (Belgium), du 06/06/2011 au 09/06/2011).
Permanent URL http://hdl.handle.net/2078.1/130511