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Measuring Cell Wall Thickness in Living Yeast Cells Using Single Molecular Rulers.
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Document type | Article de périodique (Journal article) – Article de recherche |
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Access type | Accès restreint |
Publication date | 2010 |
Journal information | "ACS Nano" - Vol. 4, no. 9, p. 5498-504 (2010) |
Peer reviewed | yes |
Publisher | American Chemical Society ((United States) Washington D.C.) |
issn | 1936-0851 |
e-issn | 1936-086X |
Publication status | Publié |
Affiliations |
UCL
- SST/IMCN/BSMA - Bio and soft matter UCL - SST/IMCN - Institute of Condensed Matter and Nanosciences |
MESH Subject | Saccharomyces cerevisiae - cytology - genetics ; Mutation ; Microscopy, Atomic Force - methods ; Cell Wall - chemistry ; Base Sequence |
Links |
Bibliographic reference | Dupres, Vincent ; Dufrêne, Yves ; Heinisch, Jürgen J. Measuring Cell Wall Thickness in Living Yeast Cells Using Single Molecular Rulers.. In: ACS Nano, Vol. 4, no. 9, p. 5498-504 (2010) |
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Permanent URL | http://hdl.handle.net/2078.1/33227 |