Parvais, Bertrand
[UCL]
Pallandre, A.
Jonas, Alain M.
[UCL]
Raskin, Jean-Pierre
[UCL]
Stiction remains one of the biggest reliability problems in the fabrication of microelectromechanical systems (MEMS). This work investigates the techniques adapted to release thin-film devices (100 nm thick) and submicron gaps MEMS. First, a CMOS compatible wet release process was developed, using nonchlorinated silanes coating providing a high hydrophobicity (contact angle in the range of 110 degrees). Second, a vapor phase release process based on the same chemistry is shown to be adequate to release thin-film beams from a silicon-on-insulator wafer, where the wet process failed. This is to the authors' knowledge the first time that an in-use stiction-free release process has been demonstrated for such thin structures. The layers resist up to 300 degrees C without damage and X-ray reflectivity confirmed that homogeneous monolayers; were obtained.
Bibliographic reference |
Parvais, Bertrand ; Pallandre, A. ; Jonas, Alain M. ; Raskin, Jean-Pierre. Liquid and vapor phase silanes coating for the release of thin film MEMS. In: IEEE Transactions on Device and Materials Reliability, Vol. 5, no. 2, p. 250-254 (2005) |
Permanent URL |
http://hdl.handle.net/2078.1/39252 |