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Interferometric sensitivity with Fourier based deflectometry
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Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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Publication date | 2010 |
Language | Anglais |
Conference | "Conference on Advanced Phase Measurement Methods in Optics and Imaging ", Locarno, Switzerland (May 2010) |
Peer reviewed | yes |
Affiliation | UCL - SST/IMCN/NAPS - Nanoscopic Physics |
Links |
Bibliographic reference | Antoine, Philippe. Interferometric sensitivity with Fourier based deflectometry.Conference on Advanced Phase Measurement Methods in Optics and Imaging (Locarno, Switzerland, May 2010). |
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Permanent URL | http://hdl.handle.net/2078.1/94752 |