Novel micro-ct based characterization tool for surface roughness measurements of porous structures

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Pyka, Grzegorz Kerckhofs, Greet [UCL]

Braem, Annabel Mattheys, Tina Schrooten, Jan Wevers, Martine

Document type	Communication à un colloque (Conference Paper)
Publication date	2010
Language	Anglais
Conference	"User meeting SkyScan 2010", Mechelen, Belgium (21-22 April 2010)
Affiliations	KUL KUL
Links	http://hdl.handle.net/2078/194596[Handle]

Bibliographic reference	Pyka, Grzegorz ; Kerckhofs, Greet ; Braem, Annabel ; Mattheys, Tina ; Schrooten, Jan ; et. al. Novel micro-ct based characterization tool for surface roughness measurements of porous structures.User meeting SkyScan 2010 (Mechelen, Belgium, 21-22 April 2010).
Permanent URL	http://hdl.handle.net/2078/194596