Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe 
Tomography

Jenkins, Benjamin M.; Danoix, Frédéric; Gouné, Mohamed; Bagot, Paul Alexander J.; Peng, Zirong; Moody, Michael P.; Gault, Baptiste

doi:10.1017/S1431927620000197

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Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography

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Peng, Zirong
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Gault, Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

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Jenkins, B. M., Danoix, F., Gouné, M., Bagot, P. A. J., Peng, Z., Moody, M. P., et al. (2020). Reflections on the Analysis of Interfaces and Grain Boundaries by Atom Probe Tomography. Microscopy and Microanalysis, 26(2), 247-257. doi:10.1017/S1431927620000197.

Cite as: https://hdl.handle.net/21.11116/0000-0007-E191-6

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