We propose a nanoindentation technique based on atomic force microscopy (AFM) that allows one to deduce both indentation modulus and hardness of viscoelastic materials from the force versus penetration depth dependence, obtained by recording the AFM cantilever deflection as a function of the sample vertical displacement when the tip is pressed against (loading phase) and then removed from (unloading phase) the surface of the sample. Reliable quantitative measurements of both indentation modulus and hardness of the investigated sample are obtained by calibrating the technique through a set of different polymeric samples, used as reference materials, whose mechanical properties have been previously determined by standard indentation tests. By analyzing the dependence of the cantilever deflection versus time, the proposed technique allows one to evaluate and correct the effect of viscoelastic properties of the investigated materials, by adapting a post-experiment data processing procedure well-established for standard depth sensing indentation tests. The technique is described in the case of the measurement of indentation modulus and hardness of a thin film of poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate), deposited by chronoamperometry on an indium tin oxide (ITO) substrate.

Passeri, D., Bettucci, A., Biagioni, A., Rossi, M., Alippi, A., Tamburri, E., et al. (2009). Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study. ULTRAMICROSCOPY, 109(12), 1417-1427 [10.1016/j.ultramic.2009.07.008].

Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study

TAMBURRI, EMANUELA;LUCCI, MASSIMILIANO;DAVOLI, IVAN;
2009-01-01

Abstract

We propose a nanoindentation technique based on atomic force microscopy (AFM) that allows one to deduce both indentation modulus and hardness of viscoelastic materials from the force versus penetration depth dependence, obtained by recording the AFM cantilever deflection as a function of the sample vertical displacement when the tip is pressed against (loading phase) and then removed from (unloading phase) the surface of the sample. Reliable quantitative measurements of both indentation modulus and hardness of the investigated sample are obtained by calibrating the technique through a set of different polymeric samples, used as reference materials, whose mechanical properties have been previously determined by standard indentation tests. By analyzing the dependence of the cantilever deflection versus time, the proposed technique allows one to evaluate and correct the effect of viscoelastic properties of the investigated materials, by adapting a post-experiment data processing procedure well-established for standard depth sensing indentation tests. The technique is described in the case of the measurement of indentation modulus and hardness of a thin film of poly(3,4-ethylenedioxythiophene) doped with poly(4-styrenesulfonate), deposited by chronoamperometry on an indium tin oxide (ITO) substrate.
2009
Pubblicato
Rilevanza internazionale
Articolo
Esperti anonimi
Settore FIS/03 - FISICA DELLA MATERIA
Settore CHIM/03 - CHIMICA GENERALE E INORGANICA
English
Con Impact Factor ISI
Atomic force microscopy; Indentation; Mechanical properties; Hardness; Polymer
http://www.sciencedirect.com/science/article/pii/S030439910900179X
Passeri, D., Bettucci, A., Biagioni, A., Rossi, M., Alippi, A., Tamburri, E., et al. (2009). Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study. ULTRAMICROSCOPY, 109(12), 1417-1427 [10.1016/j.ultramic.2009.07.008].
Passeri, D; Bettucci, A; Biagioni, A; Rossi, M; Alippi, A; Tamburri, E; Lucci, M; Davoli, I; Berezina, S
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2108/59862
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