Home > Publications database > Hard x-ray photoemission using standing-wave excitation applied to the MgO/Fe interface |
Journal Article | PreJuSER-17393 |
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2011
APS
College Park, Md.
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Please use a persistent id in citations: http://hdl.handle.net/2128/10911 doi:10.1103/PhysRevB.83.165444
Abstract: Many applications in electronics and spintronics rely on interfaces, which are buried a few nanometers deep and thus are hardly accessible in real devices except for invasive techniques. Here, we report on hard x-ray photoemission spectroscopy combined with the x-ray standing-wave technique as a noninvasive method to access buried interfaces with a depth resolution of a few A and enhanced interface sensitivity. Within these experiments, the film thicknesses and also the thicknesses of the intermixing layers are determined. We extend the data analysis scheme previously developed for soft x-rays to the hard x-ray regime and apply the method to buried epitaxial Fe/MgO interfaces, which play a crucial role in magnetic tunnel junctions and their applications. It was found that there was no detectable intermixing or reaction of the Fe and MgO layers at the interface.
Keyword(s): J
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