Book/Report

FZJ-2018-01459

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Untersuchungen zur Sekundärionenbildung an sauerstoffbedeckten Oberflächen binärer metallischer Legierungen

Modler, G. (Corresponding author)FZJ* ; Beske, H. E.FZJ*

1980
Kernforschungsanlage Jülich, Verlag Jülich

Please use a persistent id in citations: http://hdl.handle.net/2128/17493

Report No.: Juel-1651

Abstract: Oxygen covered surfaces of the single phase alloys from the systems Cu-Ni and Cr-Ni were bombarded with o$_{2}^{+}$ ions. Sputtering yields were determined as a function of concentration by weight-loss measurements as were the intensities of all positivly charged secondary ions by mass spectrometry. The atomic ion emission was found to be representative for the total ion emission of an element. It means that the presence of cluster ions influences the intensities of atomic ions only insignificantly. For the atomic ions ionisation coefficients calculated from intensities, sputtering yields and concentrations are linearly dependent on the concentration for Ni-rich Cr-Ni-alloys. Cu-Ni-alloys show a nonlinear dependence. Possible reasons for these observations are discussed.

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Contributing Institute(s):

1. Publikationen vor 2000 (PRE-2000)

Research Program(s):

1. 899 - ohne Topic (POF3-899) (POF3-899)

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Database coverage:

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