Journal Article

FZJ-2020-01291

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Reversed-slit spectroscopy method for in situ measurement of H isotopes on plasma facing material

Jiang, X. (Corresponding author)FZJ* ; Sergienko, G.FZJ* ; Kreter, A.FZJ* ; Brezinsek, S.FZJ* ; Linsmeier, C.FZJ*

2020
Inst. of Physics London

This record in other databases:  

Please use a persistent id in citations: http://hdl.handle.net/2128/24443  doi:10.1088/1748-0221/15/01/C01007

Abstract: Optic spectroscopy methods are employed for plasma facing component (PFC) material diagnostics and H isotopes retention on various platforms. A common issue of those spectroscopy methods is the measurement sensitivity. Various improvement methods have been investigated. In the current work, a 'reversed-slit' method is explored, aiming to maximise signal input while retain a reasonably good line resolution. A thin metal wire with a diameter that is comparable to a normal slit width is placed in front of an open slit. By opening the slit the input of the emission light is maximised. The thin wire casts a line of shadow on the spectral image. The shadow line is used as the 'characteristic line' to identify and separate the spectral line of each H isotope. The result shows that an open slit of 3 mm width can bring an intensity increase of 20–30 times compared to a 100 μm wide normal slit without compromising the resolution.

---

Contributing Institute(s):

1. Plasmaphysik (IEK-4)

Research Program(s):

1. 174 - Plasma-Wall-Interaction (POF3-174) (POF3-174)

Appears in the scientific report 2020

---

Database coverage:
; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

---