Journal Article

FZJ-2020-02031

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Angular dependence of fast-electron scattering from materials

Barthel, J. (Corresponding author)FZJ* ; Cattaneo, M.FZJ* ; Mendis, B. G. ; Findlay, S. D.Extern* ; Allen, L. J.

2020
Inst. Woodbury, NY

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Please use a persistent id in citations: http://hdl.handle.net/2128/24944  doi:10.1103/PhysRevB.101.184109

Abstract: Angular resolved scanning transmission electron microscopy is an important tool for investigating the properties of materials. However, several recent studies have observed appreciable discrepancies in the angular scattering distribution between experiment and theory. In this paper we discuss a general approach to low-loss inelastic scattering which, when incorporated in the simulations, resolves this problem and also closely reproduces experimental data taken over an extended angular range. We also explore the role of ionic bonding, temperature factors, amorphous layers on the surfaces of the specimen, and static displacements of atoms on the angular scattering distribution. The incorporation of low-loss inelastic scattering in simulations will improve the quantitative usefulness of techniques such as low-angle annular dark-field imaging and position-averaged convergent beam electron diffraction, especially for thicker specimens.

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Contributing Institute(s):

1. Materialwissenschaft u. Werkstofftechnik (ER-C-2)

Research Program(s):

1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
2. JUMPA - Jülich-University of Melbourne Postgraduate Academy (FAQ 151018 SA) (FAQ 151018 SA)

Appears in the scientific report 2020

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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