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Chapter 5: Next-Generation Information Technology Systems for Fast Detectors in Electron Microscopy
Kalinin, S. V. ; Foster, I. ; Kalidindi, S. ; Kalinin, S. V. ; Lookman, T. ; van Dam, K. K. ; Yager, K. G. ; Campbell, S. I. ; Farnsworth, R. ; van Dam, M. ; Weber, D. (Corresponding author)FZJ* ; Clausen, A.FZJ* ; Dunin-Borkowski, R. E.FZJ*
2020
World Scientific
2020 Springer Nature Switzerland AG.
ISBN: 978-981-12-0444-9 (print), 978-981-12-0453-1 (electronic)
2020Handbook on Big Data and Machine Learning in the Physical Sciences: (In 2 Volumes)Volume 1: Big Data Methods in Experimental Materials DiscoveryVolume 2: Advanced Analysis Solutions for Leading Experimental Techniques / Kalinin, Sergei V {Oak Ridge National LaboratoryUSA} ; : World Scientific, 2020, ; ISBN: 978-981-12-0444-9=978-981-12-0453-1 ; doi:10.1142/11389-vol2
2020 Springer Nature Switzerland AG. : World Scientific 1-34 (2020) [10.1142/9789811204579_0005]2020
This record in other databases:
Please use a persistent id in citations: http://hdl.handle.net/2128/25432 doi:10.1142/9789811204579_0005
Contributing Institute(s):
- Physik Nanoskaliger Systeme (ER-C-1)
Research Program(s):
- 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
- ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717) (823717)
Appears in the scientific report
2020
Database coverage: ;