Home > Publications database > Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor |
Contribution to a conference proceedings/Journal Article | FZJ-2016-00492 |
; ; ; ;
2015
Elsevier
Amsterdam [u.a.]
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Please use a persistent id in citations: http://hdl.handle.net/2128/9785 doi:10.1016/j.proeng.2015.08.806
Abstract: The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image.
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