University of Illinois Urbana-Champaign

State Information-Based Solutions for Sequential Circuit Diagnosis and Testing

Boppana, Vamsi

Content Files
97-2235.pdf

Permalink

https://hdl.handle.net/2142/88509

Description

Title
State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
Author(s)
Boppana, Vamsi
Issue Date
1997-12
Keyword(s)
  • Diagnosis
  • Indistinguishability
  • DATPG
  • Partial scan
  • Untestability
  • Fault location
Date of Ingest
  • 2015-12-10T23:21:31Z
  • 2017-07-14T23:58:17Z
Publisher
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign
Series/Report Name or Number
Coordinated Science Laboratory Report no. UILU-ENG-97-2235, CRHC-97-20
Type of Resource
text
Genre of Resource
Report (Grant or Annual)
Language
en
Permalink
http://hdl.handle.net/2142/88509
Sponsor(s)/Grant Number(s)
Semiconductor Research Corporation, 96-DP-109

Owning Collections

Report - Coordinated Science Laboratory PRIMARY