WEKO3
アイテム
{"_buckets": {"deposit": "6ee7e1a2-5bbd-4b78-a34f-8b771879280b"}, "_deposit": {"id": "18692", "owners": [], "pid": {"revision_id": 0, "type": "depid", "value": "18692"}, "status": "published"}, "_oai": {"id": "oai:nagoya.repo.nii.ac.jp:00018692", "sets": ["322"]}, "author_link": ["54480", "54481", "54482", "54483", "54484"], "item_10_biblio_info_6": {"attribute_name": "書誌情報", "attribute_value_mlt": [{"bibliographicIssueDates": {"bibliographicIssueDate": "2009-04", "bibliographicIssueDateType": "Issued"}, "bibliographicIssueNumber": "3", "bibliographicPageEnd": "614", "bibliographicPageStart": "606", "bibliographicVolumeNumber": "385", "bibliographic_titles": [{"bibliographic_title": "Journal of Nuclear Materials", "bibliographic_titleLang": "en"}]}]}, "item_10_description_4": {"attribute_name": "抄録", "attribute_value_mlt": [{"subitem_description": "Blisters on single- and polycrystalline tungsten surfaces formed by hydrogen and helium ion irradiation were investigated by grazing-incidence electron microscopy (GIEM) with an ultra-high-voltage transmission electron microscope. It was found that the blister skin thickness formed by D+ irradiation of polycrystalline tungsten (PCW) was considerably larger than the calculated ion range of the implants; however, this skin thickness (or blister depth) is not related to the pre-existing grain boundaries in the PCW. Blister formation was also observed with GIEM for single crystal tungsten (SCW) irradiated with H+, D+, and He+. The critical ion fluence for blister formation in SCW is estimated to be ∼1023 H+(D+)/m2 for H(D) and ∼1021 He+/m2 for He. The size of the blisters and their skin structure depends on the irradiating conditions. Typical skin thickness was about 50–150 nm. Based on the assumption that gas particles (H2, D2, and He) accumulate within the blisters during H+, D+, and He+ irradiation, the GIEM measurements provide a means to derive an estimate of the amount of gas so accumulated, by reproducing the observed blister shapes with finite element method (FEM) calculations. From the GIEM images and FEM calculations we have estimated the number of implanted ions being retained in the blisters, and compared these amounts with published retention measurements. A mechanism for the blister formation is proposed based on the present results.", "subitem_description_language": "en", "subitem_description_type": "Abstract"}]}, "item_10_identifier_60": {"attribute_name": "URI", "attribute_value_mlt": [{"subitem_identifier_type": "DOI", "subitem_identifier_uri": "http://dx.doi.org/10.1016/j.jnucmat.2009.01.298"}, {"subitem_identifier_type": "HDL", "subitem_identifier_uri": "http://hdl.handle.net/2237/20787"}]}, "item_10_publisher_32": {"attribute_name": "出版者", "attribute_value_mlt": [{"subitem_publisher": "Elsevier", "subitem_publisher_language": "en"}]}, "item_10_relation_11": {"attribute_name": "DOI", "attribute_value_mlt": [{"subitem_relation_type": "isVersionOf", "subitem_relation_type_id": {"subitem_relation_type_id_text": "https://doi.org/10.1016/j.jnucmat.2009.01.298", "subitem_relation_type_select": "DOI"}}]}, "item_10_rights_12": {"attribute_name": "権利", "attribute_value_mlt": [{"subitem_rights": "This is the author\u0027s version of a work that was accepted for publication in Journal of Nuclear Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Nuclear Materials. v.385, n.3, 2009, p.606–614, DOI:10.1016/j.jnucmat.2009.01.298.", "subitem_rights_language": "en"}]}, "item_10_select_15": {"attribute_name": "著者版フラグ", "attribute_value_mlt": [{"subitem_select_item": "author"}]}, "item_10_source_id_7": {"attribute_name": "ISSN", "attribute_value_mlt": [{"subitem_source_identifier": "0022-3115", "subitem_source_identifier_type": "PISSN"}]}, "item_1615787544753": {"attribute_name": "出版タイプ", "attribute_value_mlt": [{"subitem_version_resource": "http://purl.org/coar/version/c_ab4af688f83e57aa", "subitem_version_type": "AM"}]}, "item_access_right": {"attribute_name": "アクセス権", "attribute_value_mlt": [{"subitem_access_right": "open access", "subitem_access_right_uri": "http://purl.org/coar/access_right/c_abf2"}]}, "item_creator": {"attribute_name": "著者", "attribute_type": "creator", "attribute_value_mlt": [{"creatorNames": [{"creatorName": "Enomoto, Naruaki", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54480", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Muto, Shunsuke", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54481", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Tanabe, Tetsuo", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54482", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Davis, J.W.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54483", "nameIdentifierScheme": "WEKO"}]}, {"creatorNames": [{"creatorName": "Haasz, A.A.", "creatorNameLang": "en"}], "nameIdentifiers": [{"nameIdentifier": "54484", "nameIdentifierScheme": "WEKO"}]}]}, "item_files": {"attribute_name": "ファイル情報", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_date", "date": [{"dateType": "Available", "dateValue": "2018-02-21"}], "displaytype": "detail", "download_preview_message": "", "file_order": 0, "filename": "JNM-D-08-00137_1.pdf", "filesize": [{"value": "2.4 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_note", "mimetype": "application/pdf", "size": 2400000.0, "url": {"label": "JNM-D-08-00137_1.pdf", "objectType": "fulltext", "url": "https://nagoya.repo.nii.ac.jp/record/18692/files/JNM-D-08-00137_1.pdf"}, "version_id": "d52b7f87-df14-4228-9a5d-fb5cb3393dab"}]}, "item_language": {"attribute_name": "言語", "attribute_value_mlt": [{"subitem_language": "eng"}]}, "item_resource_type": {"attribute_name": "資源タイプ", "attribute_value_mlt": [{"resourcetype": "journal article", "resourceuri": "http://purl.org/coar/resource_type/c_6501"}]}, "item_title": "Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation", "item_titles": {"attribute_name": "タイトル", "attribute_value_mlt": [{"subitem_title": "Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation", "subitem_title_language": "en"}]}, "item_type_id": "10", "owner": "1", "path": ["322"], "permalink_uri": "http://hdl.handle.net/2237/20787", "pubdate": {"attribute_name": "PubDate", "attribute_value": "2014-11-17"}, "publish_date": "2014-11-17", "publish_status": "0", "recid": "18692", "relation": {}, "relation_version_is_last": true, "title": ["Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation"], "weko_shared_id": -1}
Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation
http://hdl.handle.net/2237/20787
http://hdl.handle.net/2237/20787e24aec7a-a826-4663-b55c-e617e6609fff
名前 / ファイル | ライセンス | アクション |
---|---|---|
JNM-D-08-00137_1.pdf (2.4 MB)
|
|
Item type | 学術雑誌論文 / Journal Article(1) | |||||
---|---|---|---|---|---|---|
公開日 | 2014-11-17 | |||||
タイトル | ||||||
タイトル | Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation | |||||
言語 | en | |||||
著者 |
Enomoto, Naruaki
× Enomoto, Naruaki× Muto, Shunsuke× Tanabe, Tetsuo× Davis, J.W.× Haasz, A.A. |
|||||
アクセス権 | ||||||
アクセス権 | open access | |||||
アクセス権URI | http://purl.org/coar/access_right/c_abf2 | |||||
権利 | ||||||
言語 | en | |||||
権利情報 | This is the author's version of a work that was accepted for publication in Journal of Nuclear Materials. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms, may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Journal of Nuclear Materials. v.385, n.3, 2009, p.606–614, DOI:10.1016/j.jnucmat.2009.01.298. | |||||
抄録 | ||||||
内容記述 | Blisters on single- and polycrystalline tungsten surfaces formed by hydrogen and helium ion irradiation were investigated by grazing-incidence electron microscopy (GIEM) with an ultra-high-voltage transmission electron microscope. It was found that the blister skin thickness formed by D+ irradiation of polycrystalline tungsten (PCW) was considerably larger than the calculated ion range of the implants; however, this skin thickness (or blister depth) is not related to the pre-existing grain boundaries in the PCW. Blister formation was also observed with GIEM for single crystal tungsten (SCW) irradiated with H+, D+, and He+. The critical ion fluence for blister formation in SCW is estimated to be ∼1023 H+(D+)/m2 for H(D) and ∼1021 He+/m2 for He. The size of the blisters and their skin structure depends on the irradiating conditions. Typical skin thickness was about 50–150 nm. Based on the assumption that gas particles (H2, D2, and He) accumulate within the blisters during H+, D+, and He+ irradiation, the GIEM measurements provide a means to derive an estimate of the amount of gas so accumulated, by reproducing the observed blister shapes with finite element method (FEM) calculations. From the GIEM images and FEM calculations we have estimated the number of implanted ions being retained in the blisters, and compared these amounts with published retention measurements. A mechanism for the blister formation is proposed based on the present results. | |||||
言語 | en | |||||
内容記述タイプ | Abstract | |||||
出版者 | ||||||
言語 | en | |||||
出版者 | Elsevier | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源タイプresource | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
出版タイプ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa | |||||
DOI | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | DOI | |||||
関連識別子 | https://doi.org/10.1016/j.jnucmat.2009.01.298 | |||||
ISSN | ||||||
収録物識別子タイプ | PISSN | |||||
収録物識別子 | 0022-3115 | |||||
書誌情報 |
en : Journal of Nuclear Materials 巻 385, 号 3, p. 606-614, 発行日 2009-04 |
|||||
著者版フラグ | ||||||
値 | author | |||||
URI | ||||||
識別子 | http://dx.doi.org/10.1016/j.jnucmat.2009.01.298 | |||||
識別子タイプ | DOI | |||||
URI | ||||||
識別子 | http://hdl.handle.net/2237/20787 | |||||
識別子タイプ | HDL |