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Increased EMI immunity in CMOS operational amplifiers using an integrated common-mode cancellation circuit
Grassi, M.; Redouté, Jean-Michel; Richelli, A.
2015In IEEE International Symposium on Electromagnetic Compatibility, 2015-Septmber, p. 34-39
Peer reviewed
 

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Keywords :
Analog integrated circuits; Buffer amplifiers; Circuit simulation; CMOS integrated circuits; Electromagnetic compatibility; Electromagnetic pulse; Reconfigurable hardware; Case-studies; CMOS operational amplifiers; CMOS technology; Folded-cascode; Large amplitude; Mathematical derivation; Offset voltage; Voltage follower; Operational amplifiers
Abstract :
[en] This paper presents an on-chip common-mode cancellation circuit which increases the immunity to electromagnetic interference (EMI) of integrated CMOS operational amplifiers when EMI is injected into their inputs. The circuits have been designed in the UMC 180nm CMOS technology. Two case studies have been considered: first, the common-mode cancellation circuit has been used in a Miller amplifier and secondly, in a folded cascode opamp topology. Circuit simulations and mathematical derivations illustrate how the proposed common-mode cancellation input stage strongly reduces the EMI susceptibility of both opamps, even in the presence of large amplitude interferences. The output offset voltages which are obtained when EMI amplitudes up to 3.3 Vpp are injected in the noninverting inputs of the proposed amplifiers when these are connected in a voltage follower configuration, are reduced by nearly one order of magnitude. © 2015 IEEE.
Disciplines :
Electrical & electronics engineering
Author, co-author :
Grassi, M.;  Dept. of Information Eng., University of Brescia, Italy
Redouté, Jean-Michel  ;  Université de Liège - ULiège > Dép. d'électric., électron. et informat. (Inst.Montefiore) > Systèmes microélectroniques intégrés
Richelli, A.;  Dept. of Information Eng., University of Brescia, Italy
Language :
English
Title :
Increased EMI immunity in CMOS operational amplifiers using an integrated common-mode cancellation circuit
Publication date :
2015
Event name :
IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
Event date :
16 August 2015 through 22 August 2015
Audience :
International
Journal title :
IEEE International Symposium on Electromagnetic Compatibility
ISSN :
1077-4076
Publisher :
Institute of Electrical and Electronics Engineers Inc.
Volume :
2015-Septmber
Pages :
34-39
Peer reviewed :
Peer reviewed
Commentary :
9781479966158
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