Article (Scientific journals)
Roughness evolution of some X-UV reflective materials induced by low energy (< 1 keV) ion beam milling
Gailly, Patrick; Jamar, Claude; Fleury-Frenette, Karl et al.
2004In Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, 216, p. 206-212
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Keywords :
surface roughness; ion beam figuring; silicon carbide; electroplated nickel
Abstract :
[en] Ion beam figuring (IBF) is an advanced technique that is been used for more than 10 years as a final step in the manufacturing of optical elements. It makes use of ion sputtering to correct shape defects but this process may eventually lead to the degradation of the surface roughness. In this study, the evolution of roughness for some optical materials subjected to the ion beam figuring process has been investigated by using optical profilometry and scanning electron microscopy. Emphasis has been made on electroplated nickel, PVD gold and CVD silicon carbide. These materials are often used for X-ray and UV applications but only limited data on their behavior under ion milling is currently available. Roughness measurements have been performed at different etching depths down to 5 mum which is representative of typical IBF treatments. The effects of using different inert gases (Ar, Kr and Xe) with ion energies ranging from 200 to 900 eV have been studied. The observed trends are an important increase of the roughness for electroplated nickel, a slight decrease for PVD gold and a slight increase for CVD silicon carbide. Results are discussed in relation to previous related works and within sputtering considerations. (C) 2003 Elsevier B.V. All rights reserved.
Disciplines :
Energy
Engineering, computing & technology: Multidisciplinary, general & others
Author, co-author :
Gailly, Patrick ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Jamar, Claude ;  Université de Liège - ULiège > Département d'astrophys., géophysique et océanographie (AGO) > Département d'astrophys., géophysique et océanographie (AGO)
Fleury-Frenette, Karl ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Medart, Pierre
Stockman, Yvan ;  Université de Liège - ULiège > CSL (Centre Spatial de Liège)
Collette, Jean-Paul
Language :
English
Title :
Roughness evolution of some X-UV reflective materials induced by low energy (< 1 keV) ion beam milling
Publication date :
February 2004
Journal title :
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
ISSN :
0168-583X
eISSN :
1872-9584
Publisher :
Elsevier Science Bv, Amsterdam, Netherlands
Volume :
216
Pages :
206-212
Peer reviewed :
Peer Reviewed verified by ORBi
Available on ORBi :
since 20 June 2011

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