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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| S1600577513026088.pdf | 646.14 kB | Adobe PDF | 見る/開く |
| タイトル: | Grazing-incidence small-angle X-ray scattering from Ge nanodots self-organized on Si(001) examined with soft X-rays. |
| 著者: | Yamamoto, Takayoshi Okuda, Hiroshi    https://orcid.org/0000-0001-7866-4876 (unconfirmed)Takeshita, Kohki Usami, Noritaka Kitajima, Yoshinori Ogawa, Hiroki |
| 著者名の別形: | 奥田, 浩司 |
| キーワード: | grazing-incidence small-angle X-ray scattering(GISAXS) soft X-ray Ge nanodot Si K absorption edge |
| 発行日: | 1-Jan-2014 |
| 出版者: | International Union of Crystallography |
| 誌名: | Journal of synchrotron radiation |
| 巻: | 21 |
| 号: | Pt 1 |
| 開始ページ: | 161 |
| 終了ページ: | 164 |
| 抄録: | Grazing-incidence small-angle X-ray scattering (GISAXS) measurements with soft X-rays have been applied to Ge nanodots capped with a Si layer. Spatially anisotropic distribution of nanodots resulted in strongly asymmetric GISAXS patterns in the qy direction in the soft X-ray region, which have not been observed with conventional hard X-rays. However, such apparent differences were explained by performing a GISAXS intensity calculation on the Ewald sphere, i.e. taking the curvature of Ewald sphere into account. |
| 著作権等: | © 2014 International Union of Crystallography |
| URI: | http://hdl.handle.net/2433/180647 |
| DOI(出版社版): | 10.1107/S1600577513026088 |
| PubMed ID: | 24365931 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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