Please use this identifier to cite or link to this item: https://hdl.handle.net/10356/89058
Title: Phase errors elimination in compact digital holoscope (CDH) based on a reasonable mathematical model
Authors: Wen, Yongfu
Qu, Weijuan
Cheng, Cheeyuen
Wang, Zhaomin
Asundi, Anand
Keywords: Phase Error
Digital Holography
DRNTU::Engineering::Mechanical engineering
Issue Date: 2015
Source: Wen, Y., Qu, W., Cheng, C., Wang, Z., & Asundi, A. (2015). Phase errors elimination in compact digital holoscope (CDH) based on a reasonable mathematical model. Proceedings of SPIE - International Conference on Experimental Mechanics 2014, 9302, 930207-. doi:10.1117/12.2077044
Conference: Proceedings of SPIE - International Conference on Experimental Mechanics 2014
Abstract: In the compact digital holoscope (CDH) measurement process, theoretically, we need to ensure the distances between the reference wave and object wave to the hologram plane exactly match. However, it is not easy to realize in practice due to the human factors. This can lead to a phase error in the reconstruction result. In this paper, the strict theoretical analysis of the wavefront interference is performed to demonstrate the mathematical model of the phase error and then a phase errors elimination method is proposed based on the advanced mathematical model, which has a more explicit physical meaning. Experiments are carried out to verify the performance of the presented method and the results indicate that it is effective and allows the operator can make operation more flexible.
URI: https://hdl.handle.net/10356/89058
http://hdl.handle.net/10220/47005
DOI: 10.1117/12.2077044
Schools: School of Mechanical and Aerospace Engineering 
Research Centres: Centre for Optical and Laser Engineering 
Rights: © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Experimental Mechanics 2014 and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2077044]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law.
Fulltext Permission: open
Fulltext Availability: With Fulltext
Appears in Collections:MAE Conference Papers

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