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Smooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map

journal contribution
posted on 2021-07-15, 00:00 authored by J Tao, Y Zhu, W Liu, F Jiang, H Liu
Smooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map

History

Journal

IEEE Sensors Journal

Volume

21

Issue

14

Pagination

16236 - 16244

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Publisher DOI

ISSN

1530-437X

eISSN

1558-1748

Publication classification

C1 Refereed article in a scholarly journal

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    Research Publications

    Categories

    Keywords

    UntaggedMechanical Engineering

    Licence

    All Rights Reserved

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