Noise conversion of Schottky diodes in mm-wave detectors under different nonlinear regimes: modeling and simulation versus measurement
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Gutiérrez Asueta, Jéssica; Zeljami, Kaoutar; Villa Benito, Enrique; Aja Abelán, Beatriz; Fuente Rodríguez, Luisa María de la; Sancho Lucio, Sergio Miguel; Pascual Gutiérrez, Juan PabloFecha
2016-05Derechos
Atribución-NoComercial-SinDerivadas 4.0 Internacional
Publicado en
International Journal of Microwave and Wireless Technologies, 2016, 8 (3), 479–493
Editorial
Cambridge University Press
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Palabras clave
Schottky diodes
Nonlinear circuits
1/f noise
Shot noise
Detectors
Conversion matrix
Resumen/Abstract
This paper presents and discusses several methods for predicting the low-frequency (LF) noise at the output of a mm-wave detector. These methods are based on the extraction of LF noise source parameters from the single diode under a specific set of bias conditions and the transfer or conversion of these noise sources, under different operating conditions including cyclostationary regime, to the quasi-dc output of a mm-wave detector constructed with the same model of diode. The noise analysis is based on a conversion-matrix type formulation, which relates the carrier noisy sidebands of the input signal with the detector output spectrum through a pair of transfer functions obtained in commercial software. Measurements of detectors in individual and differential setups will be presented and compared with predictions.
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