A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences

0566384 - FZÚ 2023 RIV GB eng J - Článek v odborném periodiku
Laštovička-Medin, G. - Kramberger, G. - Rebarz, Mateusz - Andreasson, Jakob - Kropielnicki, Kamil - Laštovička, Tomáš - Kroll, Jiří
A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences.
Journal of Instrumentation. Roč. 17, č. 7 (2022), č. článku C07020. ISSN 1748-0221. E-ISSN 1748-0221
Grant CEP: GA MŠMT(CZ) LM2018141; GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447
Grant ostatní: OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Institucionální podpora: RVO:68378271
Klíčová slova: charge induction * radiation-hard detectors * solid state detectors * timing detectors
Obor OECD: Fluids and plasma physics (including surface physics)
Impakt faktor: 1.3, rok: 2022
Způsob publikování: Omezený přístup
https://doi.org/10.1088/1748-0221/17/07/C07020

LGAD sensors will be employed in the CMS MTD and ATLAS HGTD upgrades to mitigate the high levels of pile-up expected in the High Luminosity phase of the LHC. Over the last several years, much attention has been focused on designing radiation tolerant gain implants to ensure that these sensors survive the expected fluences, (more than 1–2 × 1015 neq/cm2). However, in test beams with protons and a fs-laser, highly irradiated LGADs operated at a high voltage, have been seen to exhibit violent burn-out events that render the sensors inoperable. This paper will focus on the critical electric field and accordingly the bias thresholds to mitigate the risk of Single Event Burnout (SEB).
Trvalý link: https://hdl.handle.net/11104/0337732