Test beam measurement of ATLAS ITk Short Strip module at warm and cold operational temperature

0572408 - FZÚ 2024 RIV US eng J - Článek v odborném periodiku
Arling, J.H. - Becot, C. - Buchanan, E. - Dopke, J. - Gallop, B. - Kaplon, J. - Keller, J.S. - Kroll, Jiří - Li, Y. - Li, Z. - Liu, J. - Liu, Y. - Ng, S.Y. - Přívara, Radek - Renardi, A. - Rodriguez, A.R. - Rossi, E. - Ruehr, F. - Sawyer, C. - Sperlich, D. - Weidberg, A.R. - Zhang, D.F.
Test beam measurement of ATLAS ITk Short Strip module at warm and cold operational temperature.
Journal of Instrumentation. Roč. 18, č. 3 (2023), č. článku P03015. ISSN 1748-0221. E-ISSN 1748-0221
Grant CEP: GA MŠMT(CZ) LTT17018; GA MŠMT(CZ) LM2018104
GRANT EU: European Commission(XE) 654168 - AIDA-2020
Institucionální podpora: RVO:68378271
Klíčová slova: analysis and statistical methods * particle tracking detectors * performance of High Energy Physics Detectors
Obor OECD: Particles and field physics
Impakt faktor: 1.3, rok: 2022
Způsob publikování: Open access

This study is focused on an investigation of the performance of the Short Strip module developed by the ATLAS Inner Tracker (ITk) strip collaboration using electron beams of energy 5.4 GeV and 5.8 GeV at the DESY-II Testbeam Facility. The noise at +30 degrees C and30 degrees C was measured. The ratio of the two measurements is compared with a circuit-model calculation. The measured noise at30 degrees C is compared with the maximum noise that would correspond to an acceptable signal-to-noise ratio after the expected radiation damage from operation at HL-LHC. The measured charge distributions at +30 degrees C and30 degrees C are compared with GEANT4 simulations. The detection efficiency and noise-occupancy were measured as a function of threshold at both +30 degrees C and30 degrees C. The average cluster width was measured as a function of threshold. Scans of detection efficiency versus threshold at different delay settings were used to reconstruct the pulse shape in time. The resulting pulse shape was compared with a circuit model calculation.
Trvalý link: https://hdl.handle.net/11104/0348881