Direct atom-resolved imaging of oxides and their grain boundaries

Zhang, Z. L.; Sigle, W.; Phillipp, F.; Rühle, M.

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Direct atom-resolved imaging of oxides and their grain boundaries

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Zhang, Z. L.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp, F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zhang, Z. L., Sigle, W., Phillipp, F., & Rühle, M. (2003). Direct atom-resolved imaging of oxides and their grain boundaries. Science, 302, 846-849.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-2C25-2

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