Blumenau, A. T. Atomistic Modelling in Interface Science, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Blumenau, A. T. (2007). Extended defects in GaN from an atomistic modelling point view. Talk presented at OPTO 2007, Integrated Optoelectronic Devices. San Jose, California, USA. 2007-01-20 - 2007-01-25.