Maximum-Entropy reconstruction of local emissivity profiles from soft X-ray 
chord-measurements

von der Linden, W.; Ertl, K.; Dose, V.

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

書籍の一部

Maximum-Entropy reconstruction of local emissivity profiles from soft X-ray chord-measurements

MPS-Authors

/persons/resource/persons109811

von der Linden, W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109050

Ertl, K.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons108968

Dose, V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

von der Linden, W., Ertl, K., & Dose, V. (1994). Maximum-Entropy reconstruction of local emissivity profiles from soft X-ray chord-measurements. In K., Spatschek, & J., Uhlenbusch (Eds.), Contributions to High-Temperature Plasma Physics (pp. 131-142). Berlin: Akademie Verlag.

引用: https://hdl.handle.net/11858/00-001M-0000-0027-8FBD-1

要旨

要旨はありません