Towards monomaterial p-n junctions: single-step fabrication of tin oxide films 
and their non-destructive characterisation by angle-dependent X-ray 
photoelectron spectroscopy

Krzywiecki, Maciej; Sarfraz, Adnan; Erbe, Andreas

doi:10.1063/1.4937003

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Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy

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Sarfraz, Adnan
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe, Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Krzywiecki, M., Sarfraz, A., & Erbe, A. (2015). Towards monomaterial p-n junctions: single-step fabrication of tin oxide films and their non-destructive characterisation by angle-dependent X-ray photoelectron spectroscopy. Applied Physics Letters, 107(23):. doi:10.1063/1.4937003.

引用: https://hdl.handle.net/11858/00-001M-0000-0029-2749-5

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