Combined multifrequency EPR and DFT study of dangling bonds in a-Si:H

Fehr, Matthias; Schnegg, A.; Rech, Bernd; Lips, Klaus; Astakhov, Oleksandr; Finger, F.; Pfanner, Gernot; Freysoldt, Christoph; Neugebauer, Jörg; Bittl, Robert; Teutloff, Christian

doi:10.1103/PhysRevB.84.245203

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Combined multifrequency EPR and DFT study of dangling bonds in a-Si:H

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Pfanner, Gernot
Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Freysoldt, Christoph
Defect Chemistry and Spectroscopy, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Neugebauer, Jörg
Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Fehr, M., Schnegg, A., Rech, B., Lips, K., Astakhov, O., Finger, F., Pfanner, G., Freysoldt, C., Neugebauer, J., Bittl, R., & Teutloff, C. (2011). Combined multifrequency EPR and DFT study of dangling bonds in a-Si:H. Physical Review B, 84:, pp. 1-10. doi:10.1103/PhysRevB.84.245203.

引用: https://hdl.handle.net/11858/00-001M-0000-0019-2E43-2

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