Magnetization dynamics in NiFe thin films
Date
2011-04-12
Authors
Santoni, Albert
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Abstract
The morphology, composition, and magnetic properties of NiFe thin films were characterized. Films with thicknesses up to 137 nm were deposited in an RF induction evaporator at high vacuum (10^-8 mbar). Time resolved magneto-optic Kerr effect microscopy (TR-MOKE) was used to measure the Gilbert damping constant, an important dynamic magnetic property with applications to magnetic data storage. The composition of each film was measured with energy-dispersive X-ray (EDX) microscopy and used to determine the weight percent of Ni and Fe in each film.
A trend of increased damping with increased thickness was found, in agreement with published results. Magnetic properties and roughness were found to differ significantly from previous films grown in the same vacuum chamber by Rudge, and are attributed to different growth modes produced by differing deposition conditions. However, the weight percent of Ni in each film was found to be inconsistent, deviating by up to 7% from the Ni80Fe20 evaporation source. Inconsistent composition, caused by the inability to control deposition parameters, prevents insight into Gilbert damping from being drawn from the analysis.
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Keywords
magnetization dynamics, permalloy, ferromagnetic thin films, magneto-optic kerr effect, gilbert damping